PRWeb.com Press Release Feed - PRWeb Press Release Account Feed http://www.rsspad.com/rss2a/106370.xml PRWeb.com Press Release Feed - Press Releases en xml@emediawire.com xml@emediawire.com 30 Thin Film Photovoltaic Test System from CRAIC Technologies http://www.prweb.com/releases/2009/07/prweb2621584.htm CRAIC Technologies announces the QDI 2010 Film microspectrophotometer with multiple test protocols for metrology of photovoltaic cells. (PRWeb Jul 10, 2009)

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]]> Fri, 10 Jul 2009 07:00:00 GMT http://www.prweb.com/releases/2009/07/prweb2621584.htm UV-Visible-NIR Microscope for Broadband Inspection http://www.prweb.com/releases/2007/03/prweb514060.htm CRAIC Technologies introduces the UVM-2 broadband microscope for UV, visible and NIR range microscopy in both transmission and reflectance. (PRWeb Mar 26, 2007)

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]]> Mon, 26 Mar 2007 07:00:00 GMT http://www.prweb.com/releases/2007/03/prweb514060.htm CRAIC Technologies Introduces the CTR-1™ Raman Microspectrometer http://www.prweb.com/releases/2007/02/prweb506268.htm CRAIC Technologies CTR-1 Raman microspectrometer is designed for daily use for inspection of everything from semiconductors to pharmaceuticals. (PRWeb Feb 21, 2007)

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]]> Wed, 21 Feb 2007 08:00:00 GMT http://www.prweb.com/releases/2007/02/prweb506268.htm CRAIC Technologies Introduces the UVM-1™ UV-Visible-NIR Broadband Microscope http://www.prweb.com/releases/2006/11/prweb482677.htm CRAIC Technologies introduces the UVM-1™ Broadband UV-visible-NIR range microscope. With unparalleled flexibility and power, this microscope can image beyond the visible and by transmission, reflectance and even emission on the sub-micron scale. (PRWeb Nov 27, 2006)

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]]> Mon, 27 Nov 2006 08:00:00 GMT http://www.prweb.com/releases/2006/11/prweb482677.htm CRAIC Technologies Introduces QDI FilmPro™ - A Powerful New Solution for Film Thickness Measurements http://www.prweb.com/releases/2004/08/prweb152041.htm The QDI FilmPro™ software is a powerful addition to the capabilities of the QDI series microspectrophotometers. With this new software, the versatile QDI microspectrophotometers can be used to determine thin film thickness in either reflectance or transmission. Because they can determine film thicknesses from both reflectance and transmission spectra, these instruments can be used not only for the semiconductor industry, but also for development and quality control of the next generations of flat panel displays, photomasks and optical devices. And with the addition of a fluorescence package, these tools can be used for micro-contaminant analysis, making for a very versatile and powerful instrument in a single package. (PRWeb Aug 25, 2004)

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