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     <title>Nanoscience Instruments, Inc. Announces Distribution of Nascatec&#039;s Complete Line of Unique AFM Probes and Sensors</title>
     <link>http://www.prweb.com/releases/Nanoscience-Instruments/AFM-probes_Nascatec/prweb1344534.htm</link><description>   <![CDATA[ <P>To better serve its customers, Nanoscience Instruments has added a unique line of SPM sensors and MEMS devices to a growing product offering. The new Nascatec line includes NSOM probes, micro/nano-grippers (tweezers), self-sensing cantilevers, AFM probes and MEMS devices. (PRWeb Sep 17, 2008)</P>
                                <P>Read the full story at <a href="http://www.prweb.com/releases/Nanoscience-Instruments/AFM-probes_Nascatec/prweb1344534.htm">http://www.prweb.com/releases/Nanoscience-Instruments/AFM-probes_Nascatec/prweb1344534.htm</a></P>]]>
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     <title>Phoenix Lands on Mars: Swiss Atomic Force Microscope Helps Explore Mars Environment</title>
     <link>http://www.prweb.com/releases/2008/05/prweb977034.htm</link><description>   <![CDATA[ <P>Nanosurf AG is proud to contribute the first space-adapted atomic force microscope (AFM) for NASA&#039;s current Mars Mission named Phoenix. The goal of the Phoenix Mission is to answer important questions such as whether water exists in forms that support life. (PRWeb May 28, 2008)</P>
                                <P>Read the full story at <a href="http://www.prweb.com/releases/2008/05/prweb977034.htm">http://www.prweb.com/releases/2008/05/prweb977034.htm</a></P>]]>
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     <title>New Silicon-Nitride AFM Probes Announced by Nanoscience Instruments</title>
     <link>http://www.prweb.com/releases/2008/02/prweb692324.htm</link><description>   <![CDATA[ <P>Nanoscience Instruments introduces a new line of Silicon-Nitride probes for Atomic Force Microscopy (AFM). The new HYDRA series is available world-wide and fills a need in the market for AFM probes specifically designed for imaging soft materials such as biological and polymeric samples. HYDRA probes feature a unique, patent-pending design that combines low stress, silicon-nitride cantilevers with sharp Silicon tips. (PRWeb Feb 13, 2008)</P>
                                <P>Read the full story at <a href="http://www.prweb.com/releases/2008/02/prweb692324.htm">http://www.prweb.com/releases/2008/02/prweb692324.htm</a></P>]]>
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     <title>Nanoscience Instruments Launches Eastern US Sales Operations</title>
     <link>http://www.prweb.com/releases/2007/02/prweb502721.htm</link><description>   <![CDATA[ <P>Nanoscience Instruments today announced the launch of eastern US regional operations based in Rockville, Maryland. The new east coast office will help Nanoscience Instruments better support their large customer base in the east and also help grow future sales in this territory. (PRWeb Feb 6, 2007)</P>
                                <P>Read the full story at <a href="http://www.prweb.com/releases/2007/02/prweb502721.htm">http://www.prweb.com/releases/2007/02/prweb502721.htm</a></P>]]>
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     <title>Nanoscience Instruments Introduces VistaProbes - A New Line Of Budget-priced AFM Sensors</title>
     <link>http://www.prweb.com/releases/2007/01/prweb501403.htm</link><description>   <![CDATA[ <P>Nanoscience Instruments announces the launch of VistaProbes - a new line of budget-priced sensors for Atomic Force Microscopes (AFMs). The VistaProbes line is available world-wide and fills a need in the AFM probe market for low-cost sensors that also offer high performance and consistent quality. (PRWeb Jan 31, 2007)</P>
                                <P>Read the full story at <a href="http://www.prweb.com/releases/2007/01/prweb501403.htm">http://www.prweb.com/releases/2007/01/prweb501403.htm</a></P>]]>
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     <title>New Automated Atomic Force Microscope: The Nanosurf&#174; Nanite AFM </title>
     <link>http://www.prweb.com/releases/afm/automated/prweb479551.htm</link><description>   <![CDATA[ <P>Nanoscience Instruments announces the release of the Nanosurf&#174; Nanite automated AFM, a new easy to use AFM that provides true walk away time. The Nanite&#039;s batch programming, scripting capability and motorized X/Y/Z stage make it possible for users to prepare a series of routine measurements and leave the microscope to measure on its own. So, whether a process requires nanoscale measurements at random points on a large surface, or on multiple samples in a reproducible location, the batch-programmable Nanite AFM is up to the task. (PRWeb Nov 16, 2006)</P>
                                <P>Read the full story at <a href="http://www.prweb.com/releases/afm/automated/prweb479551.htm">http://www.prweb.com/releases/afm/automated/prweb479551.htm</a></P>]]>
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